Dr. Dawei Du is a computer vision researcher at Kitware, Inc., Clifton Park, NY. Before that, he was a post-doc researcher at the University at Albany, State University of New York, worked with Prof. Siwei Lyu. He received his Bachelor of Engineering and M.S. degrees from the University of Electronic Science and Technology of China in 2010 and 2013, respectively. He received his Ph.D. degree with the University of Chinese Academy of Sciences in 2018. His research interest includes machine learning and computer vision, with a focus on visual tracking, object detection and semantic segmentation. He serves as the workshop organizer for AVSS 2018, ICCV 2019, and ECCV 2020.
For more information, please refer to his personal webpage: https://sites.google.com/site/