Technical Expert Matthew McCormick will offer the workshop ‘An Overview of Multi-dimensional, Multi-modal, Image Registration Methods and their Application with the Insight Toolkit (ITK) and Tomviz’ on May 15, 2017. Technical Leader Marcus Hanwell will attend as well.
Physical Event
Brookhaven Naitonal Laboratory
W Princeton Ave, Yaphank, NY 11980
Brookhaven National Laboratory