may, 2017

15may(may 15)1:00 am17(may 17)1:00 am2017 NSLS-II And CFN Users’ MeetingMaking and Measuring in 4-Dimensions

Event Details

Technical Expert Matthew McCormick will offer the workshop ’An Overview of Multi-dimensional, Multi-modal, Image Registration Methods and their Application with the Insight Toolkit (ITK) and Tomviz’ on May 15, 2017. Technical Leader Marcus Hanwell will attend as well.

Time

15 (Monday) 1:00 am - 17 (Wednesday) 1:00 am

Location

Brookhaven Naitonal Laboratory

W Princeton Ave, Yaphank, NY 11980

Organizer

Brookhaven National Laboratory

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