Technical Expert Matthew McCormick will offer the workshop ‘An Overview of Multi-dimensional, Multi-modal, Image Registration Methods and their Application with the Insight Toolkit (ITK) and Tomviz’ on May 15, 2017. Technical Leader Marcus Hanwell will attend as well.

Physical Event

Brookhaven Naitonal Laboratory
W Princeton Ave, Yaphank, NY 11980

Brookhaven National Laboratory
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